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| | AFM |  |
Atomic force microscope probing along sample surface with sharp tip, raster scanning, and monitoring of vertical defelection. Quantitative, two-dimensional, three-dimensional images of surfaces with ultra-high reolution; measurement of surface roughnesss (such as RMS, Root Mean Square Roughness), grain size and grain size distribution. Non-contact AFM, Intermittent-contact AFM, or Contact AFM mode selected based on sample type submitted for AFM imaging.
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